期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024


题名作者出版年年卷期
EDFAS LONESTAR CHAPTER HOSTS SUCCESSFUL ONLINE WEFA NETWORKING EVENTSarah Poehlmann; Renee Parente; Joseph Caroselli; Tom Schamp20242024, vol.26, no.2
EPOXY WITH HIGH GLASS TRANSITION TEMPERATURE MEETS NASA LOW OUTGASSING SPECSNicholas Antoniou20242024, vol.26, no.2
HIGH-CAPACITY 12 nm-CLASS 32Gb DDR5 DRAM IS IDEAL FOR THE AI ERANicholas Antoniou20242024, vol.26, no.2
ADVANCED AUTOMATION AND USABILITY FEATURES ON LARGE-SAMPLE ATOMIC FORCE MICROSCOPENicholas Antoniou20242024, vol.26, no.2
ADVANCED EFA MODULE WITH COLOR-CODED MULTI-CHANNEL NANOPROBINGNicholas Antoniou20242024, vol.26, no.2
Peer-Reviewed Literature of Interest to Failure Analysis: Cornucopia of power, wide band, package, system, process, yield, test, and case studiesMichael R. Bruce20242024, vol.26, no.2
DIRECTORY OF INDEPENDENT FA PROVIDERSRosalinda M. Ring20242024, vol.26, no.2
SPOTLIGHT ON TUTORIALSBhanu P. Sood20242024, vol.26, no.2
DIFFERENTIAL LASER VOLTAGE PROBE: A BRIEF OVERVIEW AND THOUGHTS ON WHAT COULD COME NEXTKristofor Dickson20242024, vol.26, no.2
ELECTRO-THERMAL SIMULATION AND RELIABILITY OF A BALL GRID ARRAYNorelislam El Hami; Aicha Koulou; Maria Zemzami; Abdelkhalak El Hami20242024, vol.26, no.2
12345678910...



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024