期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2024, vol.26, no.2

题名作者出版年年卷期
A SHORT SUMMARY OF THE FIRST CHIPS METROLOGY WORKSHOP ON FAILURE ANALYSIS AND RELIABILITY TESTINGFelix Beaudoin20242024, vol.26, no.2
SCANNING THERMAL MICROSCOPY FOR LOCALIZING AND MONITORING DEFECTS IN ELECTRONICSSeverine Gomes20242024, vol.26, no.2
MICROSTRUCTURAL HIERARCHY DESCRIPTOR ENABLING INTERPRETATIVE AI FOR MICROELECTRONIC FAILURE ANALYSISZhiheng Huang; Ziyan Liao; Kaiwen Zheng; Xin Zeng; Yuezhong Meng; Hui Yan; Yang Liu20242024, vol.26, no.2
ELECTRO-THERMAL SIMULATION AND RELIABILITY OF A BALL GRID ARRAYNorelislam El Hami; Aicha Koulou; Maria Zemzami; Abdelkhalak El Hami20242024, vol.26, no.2
DIFFERENTIAL LASER VOLTAGE PROBE: A BRIEF OVERVIEW AND THOUGHTS ON WHAT COULD COME NEXTKristofor Dickson20242024, vol.26, no.2
SPOTLIGHT ON TUTORIALSBhanu P. Sood20242024, vol.26, no.2
DIRECTORY OF INDEPENDENT FA PROVIDERSRosalinda M. Ring20242024, vol.26, no.2
Peer-Reviewed Literature of Interest to Failure Analysis: Cornucopia of power, wide band, package, system, process, yield, test, and case studiesMichael R. Bruce20242024, vol.26, no.2
ADVANCED EFA MODULE WITH COLOR-CODED MULTI-CHANNEL NANOPROBINGNicholas Antoniou20242024, vol.26, no.2
ADVANCED AUTOMATION AND USABILITY FEATURES ON LARGE-SAMPLE ATOMIC FORCE MICROSCOPENicholas Antoniou20242024, vol.26, no.2
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