期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2023, vol.25, no.1 2023, vol.25, no.2 2023, vol.25, no.3 2023, vol.25, no.4

题名作者出版年年卷期
GUEST EDITORIAL: FAILURE ANALYSIS TURNS ANOTHER CHAPTER, AGAINEdward I. Cole20232023, vol.25, no.4
SUPERCONDUCTING X-RAY SENSORS FOR TOMOGRAPHY OF MICROELECTRONICSJoseph W. Fowler; Zachary H. Levine; Paul Szypryt; Daniel S. Swetz20232023, vol.25, no.4
LASER-BASED COPPER DEPOSITION FOR SEMICONDUCTOR DEBUG APPLICATIONSMichael DiBattista; Scott Silverman; Matthew M. Mulholland20232023, vol.25, no.4
AN INNOVATIVE MULTI-PROBE TOMOGRAPHIC ATOMIC FORCE MICROSCOPE FOR MATERIALS RESEARCH AND FAILURE ANALYSISD. Sharma; M. Tedaldi; L. Wouters; T. Hantschel; Patrick Hole; A. D. L. Humphris; U. Celano20232023, vol.25, no.4
VOLTAGE CONTRAST WITHIN ELECTRON MICROSCOPY:FROM A CURIOUS EFFECT TO DEBUGGING MODERN ICsJames Vickers; Blake Freeman; Neel Leslie20232023, vol.25, no.4
PROFILES OF CANDIDATES FOR THE EDFAS BOARD OF DIRECTORSJames Demarest20232023, vol.25, no.4
BRINGING ELECTRONICS INTO THE LIGHT OF DAY: ARIZONA STATE UNIVERSITY RESEARCH HIGHLIGHTSTed Kolasa20232023, vol.25, no.4
DIRECTORY OF INDEPENDENT FA PROVIDERSRosalinda M. Ring20232023, vol.25, no.4
LITERATURE REVIEWMichael R. Bruce20232023, vol.25, no.4
IRPS 2024Nicholas Antoniou20232023, vol.25, no.4
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