期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2023, vol.25, no.1 2023, vol.25, no.2 2023, vol.25, no.3 2023, vol.25, no.4

题名作者出版年年卷期
WHAT'S EDFAS ALL ABOUT AFTER A QUARTER CENTURY?Felix Beaudoin; Renee Parente; James Demarest20232023, vol.25, no.2
WHOLE-CHIP DELAYERING FOR FAILURE ANALYSIS AND QUALITY ASSURANCEDavid Douglass; Kyle Godin20232023, vol.25, no.2
FUNDAMENTALS OF CIRCUIT EDITDavid Akerson20232023, vol.25, no.2
FIB SEM MEETING 2023Nicholas Antoniou20232023, vol.25, no.2
IPFA 2023Nicholas Antoniou20232023, vol.25, no.2
ARTIFICIAL INTELLIGENCE APPLICATIONS IN SEMICONDUCTOR FAILURE ANALYSISAnna Safont-Andreu; Konstantin Schekotihin; Christian Burmer; Christian Hollerith; Xue Ming20232023, vol.25, no.2
ITC 2023Nicholas Antoniou20232023, vol.25, no.2
MICROSCOPY & MICROANALYSIS MEETING 2023Nicholas Antoniou20232023, vol.25, no.2
EDFAS 2023 PHOTO CONTESTNicholas Antoniou20232023, vol.25, no.2
SPOTLIGHT ON TUTORIALSBhanu P. Sood; Peter Rickhaus20232023, vol.25, no.2
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