期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2022, vol.24, no.1 2022, vol.24, no.2

题名作者出版年年卷期
CONNECTING WOMEN IN FAILURE ANALYSISRenee S. Parente20222022, vol.24, no.2
CHALLENGES FOR SYSTEM SUPPLIER FAILURE ANALYSIS ON SUBSYSTEM COMPONENTSXuming Deng; Weidong Huang; Changhong Yu; Xiongjian Wu; Yang Xu; Xiaole Zhao; Qing Gu20222022, vol.24, no.2
NANOPROBING AT LOW BEAM ENERGY, ADDRESSING CURRENT AND FUTURE NODESAndreas Rummel; Andrew Jonathan Smith20222022, vol.24, no.2
A STRATEGIC REVIEW OF A NOVEL SAMPLE PREPARATION METHOD FOR DOPANT PROFILING OF ADVANCED NODE FinFET DEVICES WITH SCANNING CAPACITANCE MICROSCOPYNirmal Adhikari; Phil Kaszuba; Gaitan Mathieu; Daminda Dahanayaka20222022, vol.24, no.2
PHYSICAL SECURITY ROADMAP FOR HETEROGENEOUS INTEGRATION TECHNOLOGYAslam A. Khan; Chengji Xi; Navid Asadizanjani20222022, vol.24, no.2
BETTER PERFORMANCE, HIGHER RELIABILITY, MORE SECURITY: RESEARCH HIGHLIGHTS FROM THE CENTER FOR ADVANCED ELECTRONICS THROUGH MACHINE LEARNINGAydin Aysu; Xu Chen; W. Rhett Davis; Sung Kyu Lim; Paul Franzon; Madhavan Swaminathan; Elyse Rosenbaum20222022, vol.24, no.2
IPFA 2022Nicholas Antoniou20222022, vol.24, no.2
MICROSCOPY & MICROANALYSIS MEETING 2022Nicholas Antoniou20222022, vol.24, no.2
ITC 2022Nicholas Antoniou20222022, vol.24, no.2
SPOTLIGHT ON TUTORIALSBhanu P. Sood20222022, vol.24, no.2
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