期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2021, vol.23, no.1 2021, vol.23, no.2 2021, vol.23, no.3

题名作者出版年年卷期
EDFAS VIRTUAL WORKSHOP HIGHLIGHTSDavid Grosjean20212021, vol.23, no.1
300 MM SILICON WAFER MARKERSNicholas Antoniou20212021, vol.23, no.1
RADIATION-IMMUNE AND REPAIRABLE CHIPS TO FABRICATE DURABLE ELECTRONICSNicholas Antoniou20212021, vol.23, no.1
NITROGEN-VACANCY MAGNETOMETRY DEVELOPMENTSNicholas Antoniou20212021, vol.23, no.1
GATAN AND DECTRIS ANNOUNCE JOINT SALES AND SERVICE AGREEMENT FOR THE STELA CAMERATed Kolasa20212021, vol.23, no.1
Peer-Reviewed Literature of Interest to Failure Analysis: Beam-Based Analysis Techniques: Part IIMichael R. Bruce20212021, vol.23, no.1
2021 CALL FOR NOMINATIONSLee Knauss20212021, vol.23, no.1
EDFAS BOARD OF DIRECTORS REPORTRenee S. Parente20212021, vol.23, no.1
ISTFA PROCEEDINGS ADDED TO ASM DIGITAL LIBRARYNicholas Antoniou20212021, vol.23, no.1
EDFAS AWARD WINNERS: RECOGNIZING INDUSTRY PIONEERS AND LEADERSLee Knauss20212021, vol.23, no.1
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