期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2019, vol.21, no.1 2019, vol.21, no.2 2019, vol.21, no.3 2019, vol.21, no.4

题名作者出版年年卷期
PREPARING FOR THE FUTURE OF FAILURE ANALYSISRyan Ross20192019, vol.21, no.4
POST-FIB CLEANING OF TEM SPECIMENS FROM 14 NM AND OTHER FINFETS BY CONCENTRATED ARGON ION MILLINGC. S. Bonifacio; M. J. Campin; K. Mcllwrath; P. E. Fischione20192019, vol.21, no.4
ESD CHALLENGES ON RFID DEVICESPeter Jacob20192019, vol.21, no.4
FASTER AND MORE ACCURATE FAILURE ANALYSIS: CIRCUIT EDITING AND SHORT LOCALIZATION PERFORMED AT SAME FIB TILT ANGLE USING MULTIPLETECHNIQUESWilliam Courbat; Jorg Jatzkowski20192019, vol.21, no.4
DEVICE RELIABILITY CHALLENGES IN ADVANCED FINFET TECHNOLOGYXinggong Wan20192019, vol.21, no.4
IEDM 2019Felix Beaudoin20192019, vol.21, no.4
2020 IRPS CONFERENCEFelix Beaudoin20192019, vol.21, no.4
EDFAS AWARDSFelix Beaudoin20192019, vol.21, no.4
EDFAS MEMBERS RECEIVE ASM AWARDFelix Beaudoin20192019, vol.21, no.4
DIRECTORY OF INDEPENDENT FA PROVIDERSRose M. Ring20192019, vol.21, no.4
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