期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



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2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2019, vol.21, no.1 2019, vol.21, no.2 2019, vol.21, no.3 2019, vol.21, no.4

题名作者出版年年卷期
EXPLORATION OF QUANTUM ELECTRONICS AND MAGNETICS FOR BEYOND CMOS COMPUTINGIan A. Young20192019, vol.21, no.3
Xe PLASMA VS. GALLIUM FIB DELAYERINGSharang Sharang; Paul Anzalone; Jozef Vincenc Obona20192019, vol.21, no.3
LARGE AREA AUTOMATED DEPROCESSING OF INTEGRATED CIRCUITS: PRESENT AND FUTUREE. L. Principe; Z. E. Russell; S. T. DiDona; M. Therezien; B. W. Kempshall; K. E. Scammon; J. J. Hagen20192019, vol.21, no.3
FAILURE ANALYSIS FOR HARDWARE ASSURANCE AND SECURITYM. Tanjidur Rahman; Navid Asadizanjani20192019, vol.21, no.3
RECENT ADVANCES IN VLSI CHARACTERIZATION USING THE TEMFrieder H. Baumann20192019, vol.21, no.3
ISTFA/2019 PREVIEWFelix Beaudoin20192019, vol.21, no.3
RESEARCH HIGHLIGHTS FROM VLSI RELIABILITY RESEARCH GROU, UNIVERSITY OF MALAYANorhayati Soin; Sharifah Fatmadiana Wan Muhamad Hatta20192019, vol.21, no.3
DESK REFERENCE UPDATE: ESSENTIAL FA TOOL GETS A MAKEOVERTejinder Gandhi20192019, vol.21, no.3



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