期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2018, vol.20, no.1 2018, vol.20, no.2 2018, vol.20, no.3 2018, vol.20, no.4

题名作者出版年年卷期
RECENT TRENDS IN COUNTERFEIT ELECTRONIC PARTSFred Schipp20182018, vol.20, no.3
ULTRASONIC BEAM INDUCED RESISTANCE CHANGEToru Matsumoto20182018, vol.20, no.3
LOCATING FAILURES IN CURRENT DEVICE NODES: EBIC/EBAC, CURRENT IMAGING AND NANOPROBINGStephan Kleindiek; Rosalinda M. Ring; Klaus Schock; Andreas Rummel; Michael Zschornack; Pascal Limbecker; Andreas Meyer; Randy Newkirk; Kevin Davidson; Matthias Kemmler20182018, vol.20, no.3
ISTFA/2018 PREVIEWEfrat Moyal20182018, vol.20, no.3
NEW SOLUTIONS FOR ACCELERATING, INNOVATING AND ENHANCING PRODUCTIVITY IN THE FAB AND LABLarry Wagner20182018, vol.20, no.3
100× MORE PRECISE NANOSCALE MEASUREMENTSEsther P. Y. Chen20182018, vol.20, no.3
SEMICONDUCTOR YIELD MODELING: A PRIMERJohn Hopkins20182018, vol.20, no.3
ARTIFICIAL INTELLIGENCE IN ELECTRONIC DESIGN AUTOMATION ASSISTING PHYSICAL FAILURE ANALYSISYu Huang20182018, vol.20, no.3



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