期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2018, vol.20, no.1 2018, vol.20, no.2 2018, vol.20, no.3 2018, vol.20, no.4

题名作者出版年年卷期
COMBINATIONAL LOGIC ANALYSIS WITH LASER VOLTAGE PROBINGVenkat Krishnan Ravikumar; Winson Lua; Gopinath Ranganathan; Angeline Phoa20182018, vol.20, no.2
DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURESZhigang Song; Laura Safran20182018, vol.20, no.2
RECENT INNOVATIONS IN EX SITU LIFT OUT APPLICATIONS AND TECHNIQUESLucille A. Giannuzzi20182018, vol.20, no.2
ESREF 2017 IN BORDEAUXNathalie Labat; Francois Marc20182018, vol.20, no.2
PHENOM-WORLD LAUNCHES NEW DESKTOP SEMSLarry Wagner20182018, vol.20, no.2
KEYSIGHT LAUNCHES AUTOMOTIVE ETHERNET SOLUTIONSClemens Helfmeier20182018, vol.20, no.2
INOVENSO INTRODUCES IEM DESKTOP SEMClemens Helfmeier20182018, vol.20, no.2
HORIBA SCIENTIFIC INTRODUCES UVISEL PLUSClemens Helfmeier20182018, vol.20, no.2
NEW MICROSCOPY TECHNIQUE REPORTED FOR NANOMECHANICAL SUBSURFACE IMAGINGClemens Helfmeier20182018, vol.20, no.2
ZEISS ENTERS SEMICONDUCTOR PROCESS CONTROL MARKETClemens Helfmeier20182018, vol.20, no.2
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