期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2018, vol.20, no.1 2018, vol.20, no.2 2018, vol.20, no.3 2018, vol.20, no.4

题名作者出版年年卷期
MONOGRAIN DEFECT IN POLYSILICON GATESThierry Parrassin; Laurent Clement20182018, vol.20, no.1
MICROSTRUCTURE AND RELIABILITY OF TIN-SILVER MICRO-COPPER PILLAR ASSEMBLIESMohammed Genanu; Babak Arfaei; Eric J. Cotts; Francis Mutuku; Eric Perfecto; Scott Pollard; Aric Shorey20182018, vol.20, no.1
DC/DC CONVERTER FAILS TO START UP WITHOUT OVERSHOOT DUE TO INTERACTION WITH INRUSH CURRENT SUPPRESSION CIRCUITRYGuo Xianxin20182018, vol.20, no.1
ISTFA 2017 HIGHLIGHTSSam Subramanian20182018, vol.20, no.1
EDFAS AWARD WINNERS: RECOGNIZING OUR INDUSTRY TRAILBLAZERS AND CONTRIBUTORSCheryl Hartfield20182018, vol.20, no.1
EDFAS BOARD OF DIRECTORS REPORTBill Vanderlinde20182018, vol.20, no.1
NEW ATOMIC FORCE MICROSCOPE STUDIES PIEZOELECTRICS AT THE NANOSCALELarry Wagner20182018, vol.20, no.1
PIEZOELECTRIC FORCE MICROSCOPY REVEALS CHARGE MAPPINGLarry Wagner20182018, vol.20, no.1
OLYMPUS LAUNCHES LASER CONFOCAL SCANNING MICROSCOPELarry Wagner20182018, vol.20, no.1
MINILOCK-PHANTOM RIE FEATURES VACUUM LOADLOCKLarry Wagner20182018, vol.20, no.1
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