期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2017, vol.19, no.1 2017, vol.19, no.2 2017, vol.19, no.3 2017, vol.19, no.4

题名作者出版年年卷期
EXAMINING EDGE-TERMINATION PERFORMANCE AND FAILURE IN VERTICAL GaN AND AlGaN POWER DIODES USING SCANNING-BEAM TECHNIQUESR. J. Kaplar; F. Leonard; K. C. Collins; A. M. Armstrong; J. R. Dickerson; M. P. King; A. A. Allerman; M. H. Crawford; A. A. Talin20172017, vol.19, no.3
PRACTICAL QUANTITATIVE SCANNING MICROWAVE IMPEDANCE MICROSCOPYSt. J. Dixon-Warren; B. Drevniok20172017, vol.19, no.3
NOVEL LENS ENABLES SUPERRESOLUTION IMAGINGLarry Wagner20172017, vol.19, no.3
NONLINEAR OPTICAL CHARACTERIZATION OF NOVEL ELECTRONIC MATERIALSMing Lei; J. Price; Yujin Cho; Farbod Shafiei; M. C. Downer20172017, vol.19, no.3
Peer-Reviewed Literature of Interest to Failure Analysis: Proximity and Near-Field TechniquesMichael R. Bruce20172017, vol.19, no.3



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