期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2017, vol.19, no.1 2017, vol.19, no.2 2017, vol.19, no.3 2017, vol.19, no.4

题名作者出版年年卷期
POSITRON BEAMS AS EFFECTIVE NONDESTRUCTIVE ANALYSIS TOOLS FOR THE SEMICONDUCTOR INDUSTRYManfred Fink; Jeremy Johnson; S. V. Nguyen20172017, vol.19, no.2
ADVANTAGES AND CHALLENGES OF 3-D ATOM PROBE TOMOGRAPHY CHARACTERIZATION OF FinFETsAndrew J. Martin; Ajay Kumar Kambham; Ahmad D. Katnani20172017, vol.19, no.2
CHARACTERIZING ORGANIC NANOCONTAMINATION IN SEMICONDUCTORS BY RESONANCE-ENHANCED NANOSCALE IR SPECTROSCOPY (AFM-IR)Anirban Roy; Jay Anderson20172017, vol.19, no.2
"WHAT STARTS HERE CHANGES THE WORLD:" RESEARCH HIGHLIGHTS FROM THE UNIVERSITY OF TEXAS AT AUSTIN, MICROELECTRONICS RESEARCH CENTER (MRC)Michael R. Bruce20172017, vol.19, no.2
THE PASSION OF INVENTINGJim Colvin20172017, vol.19, no.2
NATIONAL INSTRUMENTS UPGRADES ALL-IN-ONE VIRTUALBENCHLarry Wagner20172017, vol.19, no.2
FAILURE ANALYSIS ON SOLDERED BALL GRID ARRAYS: PART IIGert Vogel20172017, vol.19, no.2
BASIC KNOWLEDGE REQUIRED OF AN FA ENGINEERDavid Burgess20172017, vol.19, no.2



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