期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2016, vol.18, no.1 2016, vol.18, no.2 2016, vol.18, no.3 2016, vol.18, no.4

题名作者出版年年卷期
HOW TO DO FAILURE ANALYSIS FOR STRESS CRACKSDavid Burgess20162016, vol.18, no.2
SOFT-ERROR SUSCEPTIBILITY OF FinFET SRAMsAnthony S. Oates; Yi-Pin Fang20162016, vol.18, no.2
ARE TODAY'S TOOLS MEETING FA'S NEEDS?Philippe Perdu20162016, vol.18, no.2
SENSOFAR RELEASES NEW SURFACE PROFILERLarry Wagner20162016, vol.18, no.2
KEYSIGHT ANNOUNCES X-SERIES SIGNAL ANALYZERSLarry Wagner20162016, vol.18, no.2
NANOPOSITIONING CONTROLLER AVAILABLE FROM nPOINTLiz Marquard20162016, vol.18, no.2
RBD INSTRUMENTS OFFERS AES ANALYZERLiz Marquard20162016, vol.18, no.2
EM RESOLUTIONS INTRODUCES MAGNIFICATION STANDARDSLiz Marquard20162016, vol.18, no.2
KEYSIGHT OFFERS ROBUST HANDHELD DMMsLiz Marquard20162016, vol.18, no.2
KEYSIGHT AFM SYSTEM DELIVERS ULTRAFAST SCAN RATESLiz Marquard20162016, vol.18, no.2
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