期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2016, vol.18, no.1 2016, vol.18, no.2 2016, vol.18, no.3 2016, vol.18, no.4

题名作者出版年年卷期
3-D ANALYSIS OF A COPPER FLIP-CHIP INTERCONNECTION USING FIB-SEM SLICE AND VIEWMototaka Ito; Jun Kato20162016, vol.18, no.1
WIRE BONDINGLee Levine20162016, vol.18, no.1
PLASMA FIB PROVIDES VITAL DELAYERING AND SITE-SPECIFIC FAILURE ANALYSIS CAPABILITIES FOR LARGER-SCALE STRUCTURESSurendra Madala20162016, vol.18, no.1
SILICON PIPELINE OR DISLOCATION DEFECT?Yann Weber20162016, vol.18, no.1



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