期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



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2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2014, vol.16, no.1 2014, vol.16, no.3 2014, vol.16, no.4

题名作者出版年年卷期
Dual-Lens Electron Holography for Junction Profiling and Strain Mapping on Semiconductor DevicesYun-Yu Wang; Anthony Domenicucci; John Bruley20142014, vol.16, no.1
Sixth FIB-SEM WorkshopNicholas Antoniou20142014, vol.16, no.1



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