期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2013, vol.15, no.1 2013, vol.15, no.2 2013, vol.15, no.3 2013, vol.15, no.4

题名作者出版年年卷期
Failure Analysis of Electronic Material Using Cryogenic FIB-SEMNicholas Antoniou20132013, vol.15, no.3
Fast Failure Isolation of Thermal Defects, Generally ShortsKannu Wadhwa; Christian Schmidt; Larry Wagner20132013, vol.15, no.3
3-D ICs with TSVs: The Hard Work ContinuesE. Jan Vardaman20132013, vol.15, no.3



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