期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2013, vol.15, no.1 2013, vol.15, no.2 2013, vol.15, no.3 2013, vol.15, no.4

题名作者出版年年卷期
Failure Analysis Challenges for Chip-Scale PackagesSusan Li20132013, vol.15, no.2
Comparison of Off-Axis Electron Holography and Junction Staining of TEM Sections for Dopant Anomaly VisualizationSam Subramanian; Khiem Ly; Tony Chrastecky20132013, vol.15, no.2
Tool Maintenance for Failure Analysis LabsJason Higgins; Lisa Daniels; Tom Boyles20132013, vol.15, no.2
ESD and/versus EOS - What's New About It?Peter Jacob20132013, vol.15, no.2
Mitigation of Counterfeit Electronics through Macroeconomic PoliciesApek Mulay20132013, vol.15, no.2



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