期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2013, vol.15, no.1 2013, vol.15, no.2 2013, vol.15, no.3 2013, vol.15, no.4

题名作者出版年年卷期
New Challenges in Testing and Failure Analysis for Microsystems-Enabled Photovoltaics ModulesJose-Luis Cruz-Campa; Bongsang Kim; Bradley Jared; Murat Okandan; Gregory N. Nielson; Mark Ballance; Chris Nordquist; William Sweatt; Anthony Lentine20132013, vol.15, no.1
High-Speed Transient Thermoreflectance Imaging of Microelectronic Devices and CircuitsKazuaki Yazawa; Dustin Kendig; Daniel Hernandez; Kerry Maize; Shila Alavi; Ali Shakouri20132013, vol.15, no.1
Failure Analysis: What is the Problem?Dave Burgess20132013, vol.15, no.1



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