期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2013, vol.15, no.1 2013, vol.15, no.2 2013, vol.15, no.3 2013, vol.15, no.4

题名作者出版年年卷期
The IARPA Circuit Analysis Tools ProgramCarl E. McCants20132013, vol.15, no.4
Analysis of Electronic Devices with a Three-Dimensional Atom ProbeSergej Mutas20132013, vol.15, no.4
Automated Workflow Improves Speed and Precision of S/TEM Process Monitoring for 22 nm FinFET StructuresLarry Dworkin20132013, vol.15, no.4
Accelerated Reliability Testing for Power Semiconductor PackagesMichael Goroll; Reinhard Pufall20132013, vol.15, no.4
An Overview of LED TechnologyMartine Simard-Normandin20132013, vol.15, no.4
3-D ICs with TSVs: The Hard Work ContinuesE. Jan Vardaman20132013, vol.15, no.3
Fast Failure Isolation of Thermal Defects, Generally ShortsKannu Wadhwa; Christian Schmidt; Larry Wagner20132013, vol.15, no.3
Failure Analysis of Electronic Material Using Cryogenic FIB-SEMNicholas Antoniou20132013, vol.15, no.3
Mitigation of Counterfeit Electronics through Macroeconomic PoliciesApek Mulay20132013, vol.15, no.2
ESD and/versus EOS - What's New About It?Peter Jacob20132013, vol.15, no.2
12



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024