期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2012, vol.14, no.1 2012, vol.14, no.2 2012, vol.14, no.3 2012, vol.14, no.4

题名作者出版年年卷期
Magnetic Microscopy to Reconstruct 3-D Currents in Complex SystemsFulvio Infante20122012, vol.14, no.3
Challenges in Failure Analysis for Three-Dimensional IntegrationMike Bruce20122012, vol.14, no.3
Space Domain Reflectometry for Opens Detection in Stacked-Die PackagesJan Gaudestad; Vladimir V. Talanov; Po Chih Huang20122012, vol.14, no.3
TSV DevelopmentsE. Jan Vardaman20122012, vol.14, no.3
3-D System in Package - How to Cope with Increasing ChallengesWalter Mack20122012, vol.14, no.3



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