期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2012, vol.14, no.1 2012, vol.14, no.2 2012, vol.14, no.3 2012, vol.14, no.4

题名作者出版年年卷期
Finding the Invisible Contaminants in CMOS Image Sensor Pixels: The DCS TechniqueFlorian Domengie; Pierre Morin; Daniel Bauza20122012, vol.14, no.4
Review of Defect Localization Techniques for DRAMsMartin Versen20122012, vol.14, no.4
3-D System in Package - How to Cope with Increasing ChallengesWalter Mack20122012, vol.14, no.3
TSV DevelopmentsE. Jan Vardaman20122012, vol.14, no.3
Space Domain Reflectometry for Opens Detection in Stacked-Die PackagesJan Gaudestad; Vladimir V. Talanov; Po Chih Huang20122012, vol.14, no.3
Challenges in Failure Analysis for Three-Dimensional IntegrationMike Bruce20122012, vol.14, no.3
Magnetic Microscopy to Reconstruct 3-D Currents in Complex SystemsFulvio Infante20122012, vol.14, no.3
Device Analysis - A System-Related Topic?Peter Jacob20122012, vol.14, no.2
Testing the Mechanical Integrity of On-Chip InterconnectsHolm Geisler; Martin Brueckner; Petra Hofmann; Matthias U. Lehr; Michael Grillberger; Eckhard Langer20122012, vol.14, no.2
Management of Testing and Inspection Data Generated from Counterfeit Parts InspectionBhanu Sood; Paula M. George20122012, vol.14, no.2
123



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024