期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2010, vol.12, no.1 2010, vol.12, no.2 2010, vol.12, no.3 2010, vol.12, no.4

题名作者出版年年卷期
What's Been Happening with the IVAs?Edward I. Cole20102010, vol.12, no.3
Understanding the Effects of Local Structures on TIVA Profiles Using Thermal Modeling and SimulationPaiboon Tangyunyong; Edward I. Cole20102010, vol.12, no.3
Combining Refractive Solid Immersion Lens and Pulsed Laser-Induced Technique for Integrated Circuit Failure AnalysisS. H. Goh; A. C. T. Quah; V. K. Ravikumar; S. L. Phoa; V. Narang; J. M. Chin; C. M. Chua; J. C. H. Phang20102010, vol.12, no.3
Laser-Based Fault Isolation Techniques: Trends of the Last 10 YearsR. Aaron Falk20102010, vol.12, no.3



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