期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2009, vol.11, no.1 2009, vol.11, no.2 2009, vol.11, no.3 2009, vol.11, no.4

题名作者出版年年卷期
Advanced Flash Memory AnalysisKeith Harber; Sam Subramanian; Tony Chrastecky; Kheim Ly; Charles Petri20092009, vol.11, no.2
Can Sisyphus Be Happy?Philippe Perdu20092009, vol.11, no.2
Distortion-Free Measurements of Analog Circuits by Time-Resolved EmissionKeith R. Sarault; Gerben Boon20092009, vol.11, no.2
Selective Dielectric Removal for Failure Analysis of Thin Films on Semiconductor DevicesJason Benz; William Bentley; Joseph Myers20092009, vol.11, no.2
Fault Site Localization Technique by Imaging with NanoprobesTakeshi Nokuo; Hitoshi Furuya20092009, vol.11, no.2
Job Creation and New Technology InitiativesR. Aaron Falk20092009, vol.11, no.2



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