期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2008, vol.10, no.1 2008, vol.10, no.2 2008, vol.10, no.3 2008, vol.10, no.4

题名作者出版年年卷期
Agilent Introduces Options for DigitizerRosalinda M. Ring20082008, vol.10, no.3
Microsystems Application Technology Center LaunchedRosalinda M. Ring20082008, vol.10, no.3
The Information VacuumChris Henderson20082008, vol.10, no.3
The Integrated Fabless ManufacturerAlan Street20082008, vol.10, no.3
Laser-Induced Detection Sensitivity Enhancement with Laser PulsingAlfred C. T. Quah; Choon Meng Chua; Soon Huat Tan; Lian Ser Koh; Jacob C. H. Phang; Tam Lyn Tan; Chee Lip Gan20082008, vol.10, no.3
Can FIB Circuit Edit Successfully Address Interconnect Trends?Ted Lundquist; Mark Thompson; Vladimir Makarov20082008, vol.10, no.3
YESTech Offers New X3 3-D X-Ray Inspection SystemDon Miller20082008, vol.10, no.3
Take the Trail to ISTFA 2008 in Portland OregonDave Vallett20082008, vol.10, no.3
Biannual Face-to-Face EDFAS Board MeetingLee Knauss20082008, vol.10, no.3
Credence Sells Diagnostics and Characterization BusinessLarry Wagner20082008, vol.10, no.3



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