期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2007, vol.9, no.1 2007, vol.9, no.2 2007, vol.9, no.3 2007, vol.9, no.4

题名作者出版年年卷期
Use of a Nuclear Microprobe in Electronic Device CharacterizationHerve Guegan20072007, vol.9, no.4
Statistical Analysis Tool from InovysLarry Wagner20072007, vol.9, no.4
TEAM Project Achieves Microscopy BreakthroughLarry Wagner20072007, vol.9, no.4
MEMS Device Failure Analysis: Simulation and the Road AheadColin Drummond20072007, vol.9, no.4
Outsourcing failure analysisChris Henderson20072007, vol.9, no.4
New Attenuator/Switch Drivers from AgilentEdward I. Cole, Jr.20072007, vol.9, no.4
E-Beam Probing: An IC Design Debug Success StoryTed Lundquist; Tam Anayama20072007, vol.9, no.4
Electron Beam induced Damage to Diffusion ResistorsJohn Barden; Joel Harrison20072007, vol.9, no.4
Failure-Analysis Case History - Tantalum Electrolytic CapacitorStan Silvus20072007, vol.9, no.4
Teaching Nanotech through Child's PlayLarry Wagner20072007, vol.9, no.4



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