期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



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2022 2023 2024

2006, vol.8, no.1 2006, vol.8, no.2 2006, vol.8, no.3 2006, vol.8, no.4

题名作者出版年年卷期
Lock-in Infrared Microscopy with 1.4μm Resolution Using a Solid Immersion LensOtwin Breitenstein; Frank Altmann; Thorsten Riediger; Dieter Karg20062006, vol.8, no.2
How Effective Are Failure Analysis Methods for the 65 nm CMOS Technology Node?Magali Lamy; Marc de la Bardonnie; Frederic Lorut; Ryan Ross; Christophe Wyon; Laurens F. Tz. Kwakman20062006, vol.8, no.2
Bringing Closer the Logical and Physical Worlds for Device Analysis: A Case StudyRoger Nicholson20062006, vol.8, no.2
A Radiation-Hardened Structured ASICRichard S. Flores20062006, vol.8, no.2
Don't Be a Scrooge-Embracing the New Test ParadigmBrady Benware20062006, vol.8, no.2



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