期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2005, vol.7, no.1 2005, vol.7, no.2 2005, vol.7, no.3 2005, vol.7, no.4

题名作者出版年年卷期
Beyond Lithography: Computers That Assemble ThemselvesT. J. Mannos20052005, vol.7, no.4
Printed Circuit Assembly FSI (Failure Scene Investigation)Thomas Paquette20052005, vol.7, no.4
Quantitative Analysis and Depth Measurement via Magnetic Field ImagingBenaiah D. Schrag; Xiaoyong Liu; Jan S. Hoftun; Peter L. Klinger; T. M. Levin; David P. Vallett20052005, vol.7, no.4
A Novel Technique for Detecting High-Resistance Faults Using ElectroplatingH. S. Wang; J. H. Chou; H. C. Hung; H. H. Lui; W. H. Yang; L. C. Sun; C. J. Lin20052005, vol.7, no.4



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024