期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2005, vol.7, no.1 2005, vol.7, no.2 2005, vol.7, no.3 2005, vol.7, no.4

题名作者出版年年卷期
A Novel Technique for Detecting High-Resistance Faults Using ElectroplatingH. S. Wang; J. H. Chou; H. C. Hung; H. H. Lui; W. H. Yang; L. C. Sun; C. J. Lin20052005, vol.7, no.4
Quantitative Analysis and Depth Measurement via Magnetic Field ImagingBenaiah D. Schrag; Xiaoyong Liu; Jan S. Hoftun; Peter L. Klinger; T. M. Levin; David P. Vallett20052005, vol.7, no.4
Printed Circuit Assembly FSI (Failure Scene Investigation)Thomas Paquette20052005, vol.7, no.4
Beyond Lithography: Computers That Assemble ThemselvesT. J. Mannos20052005, vol.7, no.4
On-Die Parametric Analysis of SRAMBenjamin M. Mauck; Vishnumohan Ravichandran; Usman Azeez Mughal20052005, vol.7, no.3
CMOS IC Diagnostics Using the Light Emission from Off-State Leakage Currents (LEOSLC)Peilin Song; Stas Polonsky; Franco Stellari; Keith Jenkins; Alan J. Weger; Tian Xia; Shinho Cho20052005, vol.7, no.3
Electron Tomography and Three-Dimensional Aspects of Transmission Electron MicroscopyA. John Mardinly20052005, vol.7, no.3
Micro-calorimeter EDS for Advanced Semiconductor Material AnalysisBirgit Simmnacher; Rainer Weiland; Jens Hohne; Franz V. Feilitzsch; Christian Hollerith20052005, vol.7, no.2
The Nature of Nanometer Timing FailuresJaume Segura; Chuck Hawkins20052005, vol.7, no.2
Single-Cell Failures Caused by a Lateral Gate EffectMartin Versen; Achim Schramm; Peter Beer; Juergen Lindolf20052005, vol.7, no.2
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