期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2004, vol.6, no.1 2004, vol.6, no.2 2004, vol.6, no.3 2004, vol.6, no.4

题名作者出版年年卷期
Focused Ion Beam (FIB) Tunable CircuitsRichard S. Flores20042004, vol.6, no.2
Backside Analysis Using Repackaging TechniquesJianbai Zhu; Ray Harrison20042004, vol.6, no.2
Performance of Forming Substrate into Solid Immersion Lens (FOSSIL) for Backside Fault Isolation TechniquesTohru Koyama; Eiji Yoshida; Junko Komori; Yoji Mashiko20042004, vol.6, no.2
Failure analysis challengesLarry Wagner20042004, vol.6, no.2



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024