期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2024



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2004, vol.6, no.1 2004, vol.6, no.2 2004, vol.6, no.3 2004, vol.6, no.4

题名作者出版年年卷期
Breaking the Resolution Barrier in the Scanning Electron MicroscopeWilliam Vanderlinde20042004, vol.6, no.4
Square Pegs in Round HolesStan Silvus20042004, vol.6, no.4
An Overview of Molecular Computing Approaches (Part II)James C. Lyke20042004, vol.6, no.4
Thermal Solutions for Device Analysis of Integrated CircuitsRama R. Goruganthu20042004, vol.6, no.4
Ballistics Help Determine the Cause of the Columbia LossJames D. Walker; Donald J. Grosch20042004, vol.6, no.4
ISTFA 2004-From Vacuum Tubes to NanotubesMatthew L. Thayer20042004, vol.6, no.3
I/O Interface Latchup Analysis Using Optical and Electrical TestingFranco Stellar; Peilin Song; Moyra K. McManus; Robert Gauthier; Alan J. Weger; Kiran Chatty; Mujahid Muhammad; Pia Sanda20042004, vol.6, no.3
Parametric Failures Can Be a Pain in the BacksideJaume Segura; Charles F. Hawkins; Jerry M. Soden20042004, vol.6, no.3
An Overview of Molecular Computing Approaches (Part I)James C. Lyke20042004, vol.6, no.3
Failure analysis challengesLarry Wagner20042004, vol.6, no.2
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