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期刊
ISSN
1063-7397
刊名
Russian Microelectronics
参考译名
俄罗斯微电子学
收藏年代
2002~2023
全部
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2023
2023, vol.52, no.1
2023, vol.52, no.2
2023, vol.52, no.3
2023, vol.52, no.4
2023, vol.52, no.5
2023, vol.52, no.6
2023, vol.52, no.7
题名
作者
出版年
年卷期
Prototypes of Devices for Heterogeneous Hybrid Semiconductor Electronics with an Embedded Biomolecular Domain
Baranov M. A.; Karseeva E. K.; Tsybin O. Yu.
2023
2023, vol.52, no.6
MEMS Switch Based on a Cantilever with Increased Contact Force
Belozerov I. A.; Uvarov I. V.
2023
2023, vol.52, no.6
Electrophysical Parameters of PIN Photodiodes Irradiated with 60Co γ-Quanta
Kovalchuk N. S.; Lastovskii S. B.; Odzhaev V. B.; Petlitskii A. N.; Prosolovich V. S.; Shestovskii D. V.; Yavid V. Yu.; Yankovskii Yu. N.
2023
2023, vol.52, no.6
Optically Pumped Bipolar Transistor
Al’tudov Yu. K.; Gaev D. S.; Pskhu A. V.; Rekhviashvili S. Sh.
2023
2023, vol.52, no.6
Performance Estimation and Application of Analog Device using 32 nm CNFET
Tripathi S. K.; Patel Raju; Agrawal Deepak; Adhikari Manoj Singh
2023
2023, vol.52, no.6
Probe and Spectral Diagnostics of the Plasma of the BCl3–Cl2 Gas Medium
Murin D. B.; Chesnokov I. A.; Gogulev I. A.; Grishkov A. E.
2023
2023, vol.52, no.6
Design and Evaluation of Low Power CMOS Based Schmitt Trigger Circuits
Nagella Maniteja; Sahithi Kota; Neelima K.; Meruva Kumar Raja
2023
2023, vol.52, no.6
Tapered Silicon Oxide Etching for Creation of Capacitor Structures for Measurement of Dielectric Characteristics
Miakonkikh A. V.; Kuzmenko V. O.; Melnikov A. E.; Rudenko K. V.
2023
2023, vol.52, no.6
Simulation of a Vertical Ballistic Quantum-Barrier Field-Effect Transistor Based on an Undoped AlxGa1–xAs Quantum Nanowire
Pozdnyakov D. V.; Borzdov A. V.; Borzdov V. M.
2023
2023, vol.52, no.6
Implementation of an LNA Using a Microstrip Coupler as a DC-Block for Sub-6 5G Communication Systems
Mohamed Boumalkha; Lahsaini Mohammed; Griguer Hafid; El Mrabet Otman; Elhamadi Taj Eddin; Archidi Moulay El Hassane; Aoufi Jamal EL; Taouzari Mohamed
2023
2023, vol.52, no.6
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