期刊


ISSN8756-6990
刊名Optoelectronics, Instrumentation and Data Processing
参考译名光电子学、仪表与数据处理
收藏年代2000～2024



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2023, vol.59, no.1 2023, vol.59, no.2 2023, vol.59, no.3 2023, vol.59, no.4 2023, vol.59, no.5 2023, vol.59, no.6

题名作者出版年年卷期
Masked Faces Recognition Using Deep Learning Models and the Structural Similarity MeasureAbdelwhab, OuahabAbdelwhab, Ouahab20232023, vol.59, no.6
Separation of Spectral Lines from a Broadband Background and Noise Filtering by Modified Tikhonov RegularizationLarkin, I. A.; Vagov, A. V.; Korepanov, V. I.Larkin, I. A.; Vagov, A. V.; Korepanov, V. I.20232023, vol.59, no.6
Millifluidic Cuvette for Measuring Raman Scattering from Single Oocytes Manufactured by Photopolymer StereolithographyOkotrub, K. A.; Zaitseva, Yu. V.; Adishchev, S. V.; Rakhmanova, T. A.; Amstislavskii, S. Ya.Okotrub, K. A.; Zaitseva, Yu. V.; Adishchev, S. V.; Rakhmanova, T. A.; Amstislavskii, S. Ya.20232023, vol.59, no.6
Raman and ODMR Spectroscopy of NV Centers in Nanolayers and Nanopillars of {111}Diamond after Etching with a Focused Beam of Ga IonsKartashov, I. A.; Podlesnyi, S. N.; Antonov, V. A.; Popov, V. P.; Pal'yanov, Yu. N.Kartashov, I. A.; Podlesnyi, S. N.; Antonov, V. A.; Popov, V. P.; Pal'yanov, Yu. N.20232023, vol.59, no.6
Degradation of the Properties of SOS Ferroelectric Pseudo-MOS Transistors after Irradiation with Fast Heavy Xe and Bi IonsPopov, V. P.; Antonov, V. A.; Volodin, V. A.; Miakonkikh, A. V.; Rudenko, K. V.; Skuratov, V. A.Popov, V. P.; Antonov, V. A.; Volodin, V. A.; Miakonkikh, A. V.; Rudenko, K. V.; Skuratov, V. A.20232023, vol.59, no.6
Experimental Characteristics of an Atmospheric Fiber Laser System for Detecting Acoustic Infrasonic Oscillations forGeoecological MonitoringBritvin, A. V.; Konyaev, S. I.; Poller, B. V.; Poller, A. B.; Khairetdinov, M. S.Britvin, A. V.; Konyaev, S. I.; Poller, B. V.; Poller, A. B.; Khairetdinov, M. S.20232023, vol.59, no.6
Methods of Measuring the Narrow-Band Generation Dynamics near the Generation Threshold of a Raman Fiber Laser with a Random FeedbackKirik, A. E.; Vatnik, I. D.; Gorbunov, O. A.; Churkin, D. V.Kirik, A. E.; Vatnik, I. D.; Gorbunov, O. A.; Churkin, D. V.20232023, vol.59, no.6
Unusual Properties of Raman Spectra of Carbon Graphite from Seregen Deposit (Taimyr). A New Allotropic Form of Carbon?Mel'nik, N. N.; Simakov, S. K.; Kostsov, D. S.Mel'nik, N. N.; Simakov, S. K.; Kostsov, D. S.20232023, vol.59, no.6
Raman Scattering Spectroscopy and Photoluminescence of GaAs NanowiresKalachev, I. V.; Milekhin, I. A.; Emel'yanov, E. A.; Preobrazhenskii, V. V.; Tumashev, V. S.; Milekhin, A. G.; Latyshev, A. V.Kalachev, I. V.; Milekhin, I. A.; Emel'yanov, E. A.; Preobrazhenskii, V. V.; Tumashev, V. S.; Milekhin, A. G.; Latyshev, A. V.20232023, vol.59, no.6
Raman Scattering of Light in Thin Films of Fe, Cr, and Ca Silicides on Silicon and SapphireGalkin, N. G.; Galkin, K. N.; Kropachev, O. V.; Maslov, A. M.; Chernev, I. M.; Subbotin, E. Yu.; Goroshko, D. L.Galkin, N. G.; Galkin, K. N.; Kropachev, O. V.; Maslov, A. M.; Chernev, I. M.; Subbotin, E. Yu.; Goroshko, D. L.20232023, vol.59, no.6
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