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期刊
ISSN
8756-6990
刊名
Optoelectronics, Instrumentation and Data Processing
参考译名
光电子学、仪表与数据处理
收藏年代
2000~2023
全部
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2016, vol.52, no.1
2016, vol.52, no.2
2016, vol.52, no.3
2016, vol.52, no.4
2016, vol.52, no.5
2016, vol.52, no.6
题名
作者
出版年
年卷期
Analysis of Random Point Images with the Use of Symbolic Computation Codes and Generalized Catalan Numbers
A. L. Reznik; A. V. Tuzikov; A. A. Solov'ev; A. V. Torgov
2016
2016, vol.52, no.6
Methods of Image Reconstruction and Hardware Function Evaluation Based on a Thinned Observation Matrix
V. K. Klochko; V. P. Kuznetsov
2016
2016, vol.52, no.6
Measuring Information Signal Parameters under Additive Non-Gaussian Correlated Noise
V. M. Artyushenko; V. I. Volovach
2016
2016, vol.52, no.6
Comparative Analysis of the Performance of Laser Doppler Systems using Maximum Likelihood and Phase Increment Methods
V. S. Sobolev; F. A. Zhuravel'; G. A. Kashcheeva
2016
2016, vol.52, no.6
Development of Active Filtering Algorithms for Higher Harmonics in Electrical Power Circuits
O. V. Nos; S. V. Brovanov; M. A. Dybko
2016
2016, vol.52, no.6
Spectral Method for Processing Signals of a High-Accuracy Laser Radar
A. V. Klimov; V. G. Glavnyi; G. V. Bakakin; V. G. Meledin
2016
2016, vol.52, no.6
Calculation of the Object Edge Position after Its Projection in a Spatially Noninvariant Coherent Optical System
Yu. V. Chugui
2016
2016, vol.52, no.6
Boson Peak in Low-Frequency Raman Spectra of Polymethylmethacrylate
M. A. Korshunov; V. F. Shabanov
2016
2016, vol.52, no.6
Measurement of the Characteristics of Ultrahigh-Frequency Optical Modulators by a Scanning Interferometer
S. N. Atutov; S. L. Mikerin; A. E. Simanchuk; V. A. Sorokin; A. I. Plekhanov
2016
2016, vol.52, no.6
Optoelectronic Scanning System Upgrade by Energy Center Localization Methods
W. Flores-Fuentes; O. Sergiyenko; J. C. Rodriguez-Quinonez; M. Rivas-Lopez; D. Hernandez-Balbuena; L. C. Basaca-Preciado; L. Lindner; F. F. Gonzalez-Navarro
2016
2016, vol.52, no.6
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