期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2015, vol.44, no.1 2015, vol.44, no.2 2015, vol.44, no.3 2015, vol.44, no.4 2015, vol.44, no.5 2015, vol.44, no.6
2015, vol.44, no.7 2015, vol.44, no.8

题名作者出版年年卷期
Simulation of the Spectroscopic Response of Photonic Isomers with NV Centers. Part IA. V. Tsukanov20152015, vol.44, no.4
Investigating the Effect of Amplitude and Phase Relaxation on the Quality of Quantum Information TechnologiesYu. I. Bogdanov; B. I. Bantysh; A. Yu. Chernyavskiy; V. F. Lukichev; A. A. Orlikovsky20152015, vol.44, no.4
Analysis of Characteristics for Periodically Doped Channel Field-Effect Transistors under Extreme Thermal ConditionsA. A. Krasnyuk; O. M. Orlov; E. F. Imametdinov; E. V. Mar'ina20152015, vol.44, no.4
Computer Simulation of the Heat Distribution Element for High-Power Microwave TransistorsI. A. Glinskii; N. V. Zenchenko20152015, vol.44, no.4
Multiple-Pixel X-ray Linear Detector Based on Single CdZnTe CrystalsV. F. Dvoryankin; G. G. Dvoryankina; Yu. M. Dikaev; A. A. Kudryashov; A. G. Petrov; A. A. Telegin20152015, vol.44, no.4
Electrical Properties of Contacts with the IrSi-Si-Based Schottky BarrierE. A. Kerimov20152015, vol.44, no.4
Formation of Copper-Based Interconnects for GaAs Monolithic Microwave Integrated CircuitsS. V. Ishutkin; V. A. Kagadey; E. V. Erofeev; E. V. Anishchenko20152015, vol.44, no.4
Noise Immunity of a 28-nm Two-Phase CMOS Combinational Logic to Transient Effects of Single Nuclear ParticlesYu. V. Katunin; V. Ya. Stenin20152015, vol.44, no.4
Error Correction Coding for 28-nm CMOS Two-Phase Logic ElementsYu. V. Katunin; K. E. Levin20152015, vol.44, no.4
Virtual Scanning Electron Microscope 5. Application in Nanotechnology and in Micro- and NanoelectronicsYu. A. Novikov20152015, vol.44, no.4



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