期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



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2010, vol.39, no.1 2010, vol.39, no.2 2010, vol.39, no.3 2010, vol.39, no.4 2010, vol.39, no.5 2010, vol.39, no.6

题名作者出版年年卷期
Effect of Surface Roughness on the Temperature of a Silicon Wafer Heated by Incoherent RadiationV. I. Rudakov; V. V. Ovcharov; V. P. Prigara20102010, vol.39, no.1
A New Technology for Manufacturing the Dielectric Isolation of Elements of Microelectronic Devices by Oxidizing Grooves in Single-Crystal SiliconYu. P. Snitovskii; M. G. Krasikov20102010, vol.39, no.1
Diagnosing Reliability of Integrated Circuits Using Noises and the ESD EffectM. I. Gorlov; D. Yu. Smirnov; R. M. Tikhonov20102010, vol.39, no.1
Low-Temperature Pulsed CVD of Ruthenium Thin Films for Micro- and Nanoelectronic Applications, Part 1: Equipment and MethodologyV. Yu. Vasilyev20102010, vol.39, no.1
Determination of the Diffusion Length of Charge Minority Carriers Using Digital Oscillography of Surface PhotovoltageV. N. Podshivalov20102010, vol.39, no.1
Offset Voltage of an Integrated Magnetotransistor SensorR. D. Tikhonov20102010, vol.39, no.1
Low-Voltage Arithmetic Units Based on Fully Depleted SOI CMOS NanotransistorsN. V. Masal'skii20102010, vol.39, no.1
Intersubband Optical Transitions in InAs/GaSb Quantum WellsI. A. Semenikhin; A. A. Zakharova; K. A. Chao20102010, vol.39, no.1



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