期刊


ISSN0895-2477
刊名Microwave and Optical Technology Letters
参考译名微波和光学技术快报
收藏年代2002~2024

关联期刊参考译名收藏年代
Microwave and Optical Technology Letters微波和光学技术快报 


全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023 2024

2009, vol.51, no.1 2009, vol.51, no.10 2009, vol.51, no.11 2009, vol.51, no.12 2009, vol.51, no.2 2009, vol.51, no.3
2009, vol.51, no.4 2009, vol.51, no.5 2009, vol.51, no.6 2009, vol.51, no.7 2009, vol.51, no.8 2009, vol.51, no.9

题名作者出版年年卷期
TERAHERTZ GENERATION AND DETECTION SETUP BASED ON PUMPPROBE SCHEMEZhen Zhou; An-Tao Chen; Li-Shuang Feng; Xiang-Jun Xin; Chong-Xiu Yu20092009, vol.51, no.7
SUBSTRATE-INTEGRATED-WAVEGUIDE FEED NETWORK FOR MICROSTRIP ANTENNA ARRAYSMohsen Yousefbeigi; Mahmoud Shahabadi20092009, vol.51, no.7
EMBEDDED DUAL FIBER BRAGG GRATING SENSOR FOR SIMULTANEOUS MEASUREMENT OF TEMPERATURE AND LOAD (STRAIN) WITH ENHANCED SENSITIVITYSamir K. Mondal; Vandana Mishra; Umesh Tiwari; G. C. Poddar; Nahar Singh; Subhash C. Jain; S. N. Sarkar; Pawan Kapur20092009, vol.51, no.7
A WIDEBAND CIRCULARLY POLARIZED MICROSTRIP ANTENNA ARRAY WITH SINGLE FEEDINGPing Yao; Yang Yu; Wenquan Che; Wentao Chen20092009, vol.51, no.7
BROADBAND CLOAKING WITH VOLUMETRIC STRUCTURES COMPOSED OF TWO-DIMENSIONAL TRANSMISSION-LINE NETWORKSPekka Alitalo; Olli Luukkonen; Juan R. Mosig; Sergei A. Tretyakov20092009, vol.51, no.7
MINIATURE 60-GHz-BAND BANDPASS FILTER WITH 2.55-dB INSERTION-LOSS USING STANDARD 0.13 μm CMOS TECHNOLOGYMei-Ching Lu,; Jin-Fa Chang; Li-Chun Lu; Yo-Sheng Lin20092009, vol.51, no.7
COMPACT MULTILAYER DUAL-BAND FILTER USING SLOT COUPLED STEPPED-IMPEDANCE-RESONATORS STRUCTUREA. Djaiz; M. Nedil; A. M. Habib; T. A. Denidni20092009, vol.51, no.7
SHORT-ENDED COAXIAL CYLINDER PROBE MEASURING BULK DIELECTRIC CONSTANT USING TDRYoung-Jin Park20092009, vol.51, no.7
PRINTED DOUBLE-T MONOPOLE ANTENNAS FOR TRIBAND APPLICATIONSRakhesh Singh Kshetrimayum20092009, vol.51, no.7
ELIMINATION OF THE DEPENDENCY OF THE CALIBRATION PLANE AND THE SAMPLE THICKNESS FROM COMPLEX PERMITTIVITY MEASUREMENTS OF THIN MATERIALSU. C. Hasar; O. E. Inan20092009, vol.51, no.7
123456