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期刊
ISSN
0946-7076
刊名
Microsystem technologies
参考译名
微系统技术:传感器,致动器与系统集成
收藏年代
1998~2024
关联期刊
参考译名
收藏年代
Journal of Information Storage and Processing Systems
存储与处理系统信息杂志
2000~2001
全部
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2009, vol.15, no.1
2009, vol.15, no.10/11
2009, vol.15, no.12
2009, vol.15, no.2
2009, vol.15, no.3
2009, vol.15, no.4
2009, vol.15, no.5
2009, vol.15, no.6
2009, vol.15, no.7
2009, vol.15, no.8
2009, vol.15, no.9
题名
作者
出版年
年卷期
A silicon test chip for the thermomechanical analysis of MEMS packagings
Soeren Majcherek; Thomas Leneke; Soeren Hirsch
2009
2009, vol.15, no.1
Macroscopic invisible cables
Nicola M. Pugno
2009
2009, vol.15, no.1
Poly-Si extensions and etching residues as a reliability risk
Peter Jacob
2009
2009, vol.15, no.1
TSV constraints related to temperature excursion, pressure during molding, materials used and handling loads
Tomasz Falat; Kazimierz Friedel; Norman Marenco; Stephan Warnat
2009
2009, vol.15, no.1
Changes in the microstructure of materials and their impact on reliability: experiments and modeling
Andreas Brandmair; Thomas Bohme; Wolfgang H. Muller
2009
2009, vol.15, no.1
Assessment of testing methodologies for thin-film vacuum MEMS packages
Qian Li; Hans Goosen; Fred van Keulen; Joost van Beek; Guoqi Zhang
2009
2009, vol.15, no.1
Design limitations related to conductive anodic filament formation in a micro-world
Antonio Caputo; Laura J. Turbini; Doug D. Perovic
2009
2009, vol.15, no.1
Interlayer cooling potential in vertically integrated packages
T. Brunschwiler; B. Michel; H. Rothuizen; U. Kloter; B. Wunderle; H. Oppermann; H. Reichl
2009
2009, vol.15, no.1
How to extract continuum materials properties for (lead-free) solders from tensile tests and nanoindentation experiments
W. H. Muller; H. Worrack; J. Sterthaus; J. Villain; J. Wilden; A. Juritza
2009
2009, vol.15, no.1
Effects of fatigue and damage on the hysteresis loops of ferroelectric ceramics
Shouwen Yu; Li Yu
2009
2009, vol.15, no.1
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