期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2008, vol.37, no.1 2008, vol.37, no.2 2008, vol.37, no.3 2008, vol.37, no.4 2008, vol.37, no.5 2008, vol.37, no.6

题名作者出版年年卷期
Evaluating the Effect of Photogeneration Nonuniformity on the Accuracy of Laser Simulation of the Transient Radiation Response in Semiconductor Devices and CircuitsA. Y. Nikiforov; P. K. Skorobogatov20082008, vol.37, no.1
Simulating Single-Event Effects Associated with High-Energy Neutrons for Different VLSI TechnologiesS. V. Baranov; B. V. Vaselegin; P. N. Osipenko; A. I. Chumakov; A. V. Yanenko20082008, vol.37, no.1
Simulating the Response of SOS CMOS Building Blocks to Pulsed Ionizing IrradiationA. V. Kirgizova; P. K. Skorobogatov; A. Y. Nikiforov; L. N. Kessarinskii; G. G. Davydov; A. G. Petrov20082008, vol.37, no.1
Evaluating the Effect of Temperature on the Accuracy of Laser Simulation of the Transient Radiation Response in Semiconductor Devices and CircuitsA. Y. Nikiforov; P. K. Skorobogatov20082008, vol.37, no.1
Current-Feedback Operational Amplifier: Some Features of Its Transient Radiation ResponseT. M. Agakhanyan20082008, vol.37, no.1
Method for Online Nondestructive Hardness Assurance for CMOS LSI Circuits Realized in SOS TechnologyG. G. Davydov; A. V. Sogoyan; A. Y. Nikiforov; A. V. Kirgizova; A. G. Petrov; A. Y. Sedakov; I. B. Yashanin20082008, vol.37, no.1
Estimating IC Susceptibility to Single-Event LatchupA. I. Chumakov; A. A. Pechenkin; A. N. Egorov; O. B. Mavritsky; S. V. Baranov; A. L. Vasil'ev; A. V. Yanenko20082008, vol.37, no.1



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  京公网安备11010202008970号  机械工业信息研究院 2018-2024