期刊


ISSN0268-3768
刊名The International Journal of Advanced Manufacturing Technology
参考译名先进制造技术国际杂志
收藏年代1998～2024



全部

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2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2007, vol.31, no.11-12 2007, vol.31, no.7-8 2007, vol.31, no.9-10 2007, vol.32, no.11-12 2007, vol.32, no.1-2 2007, vol.32, no.3-4
2007, vol.32, no.5-6 2007, vol.32, no.7-8 2007, vol.32, no.9-10 2007, vol.33, no.11-12 2007, vol.33, no.1-2 2007, vol.33, no.3-4
2007, vol.33, no.5-6 2007, vol.33, no.7-8 2007, vol.33, no.9-10 2007, vol.34, no.11-12 2007, vol.34, no.1-2 2007, vol.34, no.3-4
2007, vol.34, no.5-6 2007, vol.34, no.7-8 2007, vol.34, no.9-10

题名作者出版年年卷期
Tribological evaluation of TiN and TiAlN coated PM-HSS gear cutter when machining 19MnCr5 steelJ. A. B. O. dos Santos; W. F. Sales; S. C. Santos; A. R. Machado; M. B. da Silva; J. Bonney; E. O. Ezugwu20072007, vol.31, no.7-8
Estimation of the chatter zones of drilled holes by using s-transformationA. Yenilmez; D. Rincon; I. N. Tansel; F. I. Erazo; X. Wang; P. Chen20072007, vol.31, no.7-8
Robust and stable scheduling of a single machine with random machine breakdownsLin Liu; Han-yu Gu; Yu-geng Xi20072007, vol.31, no.7-8
The upper bound of tool edge radius for nanoscale ductile mode cutting of silicon waferS. Arefin; X. P. Li; M. Rahman; K. Liu20072007, vol.31, no.7-8
KBE-based stamping process paths generated for automobile panelsJinqiao Zheng; Yilin Wang; Zhigang Li20072007, vol.31, no.7-8
Flow patterns in gas-assisted injection molding process in a channelCheng-Hsing Hsu; Po-Chuang Chen; Kuang-Yuan Kung; Chuan Lai20072007, vol.31, no.7-8
Fabrication of WC micro-shaft by using electrochemical etchingS. H. Choi; S. H. Ryu; D. K. Choi; C. N. Chu20072007, vol.31, no.7-8
The use of ultrasonic cavitation peening to improve micro-burr-free surfacesC. K. Toh20072007, vol.31, no.7-8
Simultaneous process mean and process tolerance determination with asymmetrical loss functionAngus Jeang; Chien-Ping Chung; Chih-Kuang Hsieh20072007, vol.31, no.7-8
Development of a new cluster index for wafer defectsLee-Ing Tong; Chung-Ho Wang; Da-Lun Chen20072007, vol.31, no.7-8
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