期刊


ISSN0013-4686
刊名Electrochimica Acta
参考译名国际电化学杂志：电化学学报
收藏年代1998～2024



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1998 1999 2000 2001 2002 2003
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2006, vol.51, no.10 2006, vol.51, no.11 2006, vol.51, no.12 2006, vol.51, no.13 2006, vol.51, no.14 2006, vol.51, no.15
2006, vol.51, no.16 2006, vol.51, no.17 2006, vol.51, no.18 2006, vol.51, no.19 2006, vol.51, no.20 2006, vol.51, no.21
2006, vol.51, no.22 2006, vol.51, no.23 2006, vol.51, no.23 2 2006, vol.51, no.24 2006, vol.51, no.25 2006, vol.51, no.26
2006, vol.51, no.27 2006, vol.51, no.28 2006, vol.51, no.7 2006, vol.51, no.8-9 2006, vol.52, no.1 2006, vol.52, no.2
2006, vol.52, no.3 2006, vol.52, no.4

题名作者出版年年卷期
Reflections on the history of electrochemical impedance spectroscopyDigby D. Macdonald20062006, vol.51, no.8-9
Nonlinear electrochemical impedance spectroscopy for solid oxide fuel cell cathode materialsJ. R. Wilson; D. T. Schwartz; S. B. Adler20062006, vol.51, no.8-9
Improvement of the impedance measurement reliability by some new experimental and data treatment procedures applied to the behavior of copper in neutral chloride solutions containing small heterocycle moleculesO. L. Blajiev; T. Breugelmans; R. Pintelon; A. Hubin20062006, vol.51, no.8-9
Simultaneous EIS and in situ microscope observation on a partially blocked electrode application to scale electrodepositionO. Devos; C. Gabrielli; B. Tribollet20062006, vol.51, no.8-9
Scanning Photo-Induced Impedance Microscopy - Resolution studies and polymer characterizationSteffi Krause; Werner Moritz; Habib Talabani; Ming Xu; Andrea Sabot; Graham Ensell20062006, vol.51, no.8-9
Microimpedance - Localized material analysisM. M. Lohrengel; S. Heiroth; K. Kluger; M. Pilaski; B. Walther20062006, vol.51, no.8-9
The evaluation of experimental dielectric data of barrier coatings in frequency- and time domainW. Strunz; C. A. Schiller; J. Vogelsang20062006, vol.51, no.8-9
Electrochemical impedance spectroscopy in the presence of non-linear distortions and non-stationary behaviour, Part II. Application to crystallographic pitting corrosion of aluminiumE. Van Gheem; R. Pintelon; A. Hubin; J. Schoukens; P. Verboven; O. Blajiev; J. Vereecken20062006, vol.51, no.8-9
Benefits of evolutionary strategy in modeling of impedance spectraO. Kanoun; U. Troltzsch; H.-R. Trankler20062006, vol.51, no.8-9
A model for copper deposition in the damascene processC. Gabrielli; P. Mocoteguy; H. Perrot; D. Nieto-Sanz; A. Zdunek20062006, vol.51, no.8-9
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