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2004, vol.9, no.1	2004, vol.9, no.10	2004, vol.9, no.11	2004, vol.9, no.12	2004, vol.9, no.2	2004, vol.9, no.3
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题名	作者	出版年	年卷期
Vision and scanning probes inspect photomask defects: To check critical dimensions., advanced metrology systems combine visible-light microscopy with stylus nanoprofilometry	C. G. Masi	2004	2004, vol.9, no.7
Machine-vision systems offer design alternatives: Bridging the gap between smart cameras and custom designs, integrated systems provide a fast way to automate industrial processes	Andrew Wilson	2004	2004, vol.9, no.7
X-ray systems enhance machine vision: Based on amorphous-silicon, CCD, or CMOS sensors, x-ray automated optical imaging systems serve more industries	R. Winn Hardin	2004	2004, vol.9, no.7