期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



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2004, vol.33, no.1 2004, vol.33, no.2 2004, vol.33, no.3 2004, vol.33, no.4 2004, vol.33, no.5 2004, vol.33, no.6

题名作者出版年年卷期
Majority-Carrier Lifetime in the Potential Barrier of an MIS Capacitor under Monopolar ConditionsN. A. Penin20042004, vol.33, no.3
Power Consumption of Asymptotically Adiabatic Static Logic GatesV. V. Losev; V. I. StarosePskii20042004, vol.33, no.3
Circuit-Design Techniques of Radiation Hardening for Monolithic Op AmpsT. M. Agakhanyan20042004, vol.33, no.3
Anisotropic Etching of SiO{sub}2 in High-Voltage Gas-Discharge PlasmasN. L. Kazanskii; V. A. Kolpakov; A. L Kolpakov20042004, vol.33, no.3
ZnO Thin Films with Hole Conduction Produced by N{sup}+ Ion Implantation and Oxygen-Radical AnnealingA. N. Georgobiani; A. N. Gruzintsev; V. T. Volkov; M. O. Vorob'ev; V. A. Dravin20042004, vol.33, no.3
Pore Sealing on Si(001) and Si(111) in Homoepitaxy and Annealing: A Monte Carlo SimulationA. V. Zverev; I. G. Neizvestny; A. V. Chemakin; N. L. Shwartz; Z. Sh. Yanovitskaya20042004, vol.33, no.3
Optimizing Light-Source Aperture for Off-Axis Illumination in Optical Nanolithography: Theoretical ConsiderationV. V. Ivin; T. M. Makhviladze; K. A. Valiev20042004, vol.33, no.3
Phase Formation in Ti-Co-N/CoSi{sub}x/Si(100) and Ti-Co-Si-N/CoSi{sub}x/Si(100) Systems by Diffusion Reactions: The Role of NitrogenA. G. Vasiliev; A. L. Vasiliev; R. A. Zakharov; A. A. Orlikovsky; I. A. Horin; M. Eindou20042004, vol.33, no.3
Effect of Surface Roughness on Quantum Carrier Transport in Ultrathin FilmsS. D. Ananiev; V. V. V'yurkov; A. A. Orlikovsky20042004, vol.33, no.3



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