期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2003, vol.32, no.1 2003, vol.32, no.2 2003, vol.32, no.3 2003, vol.32, no.4 2003, vol.32, no.5 2003, vol.32, no.6

题名作者出版年年卷期
SOI-MOSFET threshold-voltage characteristicsS. M. Zakharov20032003, vol.32, no.1
Self-aligned technology applied to planar power MOSFETsM. A. Korolev; A. V. Shvets; R. D. Tikhonov20032003, vol.32, no.1
MBE-grown GaAs films on GaAs(111)A substrates misoriented toward [211]G. B. Galiev20032003, vol.32, no.1
Modeling molecular-ion implantation into solidsA. V. Chernyaev20032003, vol.32, no.1
Methods for the prediction of total-dose effects on modern integrated semiconductor devices in space: a reviewV. V. Belyakov; V. S. Pershenkov; G. I. Zebrev; A. V. Sogoyan; A. I. Chumakov; A. Y. Nikiforov; P. K. Skorobogatov20032003, vol.32, no.1
Statistical simulation for process design and optimization in IC manufactureA. A. Kouleshoff; V. S. Malyshev; V. V. Nelayev; V. R. Stempitsky20032003, vol.32, no.1
Statistical yield modeling for IC manufacture: hierarchical fault distributionsYu. I. Bogdanov; N. A. Bogdanova; V. L. Dshkhunyan20032003, vol.32, no.1



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