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2000, vol.2, no.12	2000, vol.67, no.1	2000, vol.67, no.10	2000, vol.67, no.11	2000, vol.67, no.12	2000, vol.67, no.2
2000, vol.67, no.3	2000, vol.67, no.4	2000, vol.67, no.5	2000, vol.67, no.6	2000, vol.67, no.7-8	2000, vol.67, no.9

题名	作者	出版年	年卷期
Calibration-free temperature measurement using parameter extraction from the p-n junction current-voltage characteristic	Olfa Kanoun; Hans Rolf Trankler	2000	2000, vol.67, no.4
Dynamical temperature compensation of precision instruments	T. Frohlich; G. Jager	2000	2000, vol.67, no.4
Flaw tracking in a sequence of digital x-ray images: a new method of automated quality control of castings	Domingo Mery; Dieter Filbert	2000	2000, vol.67, no.4
Methods to measure small capacitances with high resolution	Joachim Franz	2000	2000, vol.67, no.4
Micromechanical scanning device	W. Manthey; K. Wolf; R. Knofler; A. Bertz; E. Ahl	2000	2000, vol.67, no.4
Spatial phase-shifting speckle interferometry using four cameras	Martin Jakobi; Peter Evanschitzky; Alexander W. Koch	2000	2000, vol.67, no.4
Transit time correlation for slip-free speed measurement of rail vehicles	Thomas Engelberg	2000	2000, vol.67, no.4
Wavelets: an introduction for potential users, Part II	Roland Best	2000	2000, vol.67, no.4