期刊


ISSN1047-4838
刊名JOM
参考译名矿物、金属与材料学会会刊
收藏年代1998~2024



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2024

1999, vol.51, no.1 1999, vol.51, no.10 1999, vol.51, no.11 1999, vol.51, no.12 1999, vol.51, no.2 1999, vol.51, no.3
1999, vol.51, no.4 1999, vol.51, no.5 1999, vol.51, no.6 1999, vol.51, no.7 1999, vol.51, no.8 1999, vol.51, no.9

题名作者出版年年卷期
A metallurgical assessment of SnPbAg solder for GaAs power devicesJ. M. Parsey; Jr., S. Valocchi; W. Cronin; J. Mohr; B. L. Scrivner; K. Kyler19991999, vol.51, no.3
Characterizing and monitoring thin-film processes with spectroscopic ellipsometryArun R. Srivatsa; Carlos L. Ygartua19991999, vol.51, no.3
Educators lead increases in 1998 U.S. engineering salariesTammy M. Beazley19991999, vol.51, no.3
Materials challenges in interconnection: trade-offs for rapid deploymentKris Frutschy; Zezhong Fu; Deepak Goyal; Ken Kinsman; Gay Samuelson; Ryan Vogt19991999, vol.51, no.3
Materials issues in area-array microelectronic packagingD. R. Frear19991999, vol.51, no.3
Metallurgical issues in microelectronicsJohn M. Parsey, Jr.19991999, vol.51, no.3
Metallurgical techniques for more reliable integrated circuitsS. H. Kang; J. W. Morris, Jr.; A. S. Oates19991999, vol.51, no.3
Nondestructive evaluation techniques in semiconductor wafer fabricationArun R. Srivatsa19991999, vol.51, no.3
The impact of metals on society part VI: the new worldR. L. Smith19991999, vol.51, no.3
Using CD-SEM metrology in the manufacture of semiconductorsJohn McIntosh19991999, vol.51, no.3