期刊


ISSN0091-3286
刊名Optical Engineering
参考译名光学工程
收藏年代1998～2023



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2022 2023

1999, vol.38, no.1 1999, vol.38, no.10 1999, vol.38, no.11 1999, vol.38, no.12 1999, vol.38, no.2 1999, vol.38, no.3
1999, vol.38, no.4 1999, vol.38, no.5 1999, vol.38, no.6 1999, vol.38, no.7 1999, vol.38, no.8 1999, vol.38, no.9

题名作者出版年年卷期
Correctability and long-term stability of infrared focal plane arraysWerner Gross; Thomas Hierl; Max Schulz19991999, vol.38, no.5
Design and application of subwavelength diffractive lenses for integration with infrared photodetectorsDennis W. Prather19991999, vol.38, no.5
Developing operational performance metrics using image comparison metrics and the concept of degradation spaceCarl E. Halford; Keith A. Krapels; Ronald G. Driggers; Ellis E. Burroughs Jr.19991999, vol.38, no.5
Dynamic minimum resolvable temperature testing for staring array imagersCurtis M. Webb; Carl E. Halford19991999, vol.38, no.5
Dynamic simulation of the rosette scanning infrared seeker and an infrared counter countermeasure using the moment techniqueSurng-Gabb Jahng; Hyun-Ki Hong; Sung-Hyun Han; Jong-Soo Choi19991999, vol.38, no.5
Effects of band-pass sampling on joint transform correlationZikuan Chen; Mohammad A. Karim; Majeed M. Hayat19991999, vol.38, no.5
Elimination of higher order aliasings by multiple interlaced samplingZikuan Chen; Mohammad A. Karim; Majeed M. Hayat19991999, vol.38, no.5
Fidelity analysis of sampled imaging systemsStephen K. Park; Zia-ur Rahman19991999, vol.38, no.5
Fixed-polarizer ellipsometry: a simple technique to measure the thickness of very thin filmsBrian Trotter; Garret Moddel; Rachel Ostroff; Gregory R. Bogart19991999, vol.38, no.5
High-resolution digital resampling using vector rational filtersLazhar Khriji; Faouzi Alaya Cheikh; Moncef Gabbouj19991999, vol.38, no.5
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